By Sarah Fearn
Over the years, SIMS instrumentation has dramatically replaced because the earliest secondary ion mass spectrometers have been first built. tools have been as soon as devoted to both the intensity profiling of fabrics utilizing high-ion-beam currents to examine close to floor to bulk areas of fabrics (dynamic SIMS), or time-of-flight tools that produced advanced mass spectra of the very outer-most floor of samples, utilizing very low-beam currents (static SIMS). Now, with the advance of dual-beam tools those very distinctive fields now overlap.
Read or Download An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics) PDF
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This ebook highlights the appliance of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution floor research and characterization of fabrics. whereas supplying a quick assessment of the foundations of SIMS, it additionally presents examples of ways dual-beam ToF-SIMS is used to enquire more than a few fabrics structures and homes.
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